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Author: John C. Stover
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819492517
Category : Light
Languages : en
Pages : 0
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Book Description
The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light.
Author: John C. Stover
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819492517
Category : Light
Languages : en
Pages : 0
Get Book
Book Description
The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light.
Author: John C. Stover
Publisher:
ISBN: 9781628418408
Category : Light
Languages : en
Pages : 0
Get Book
Book Description
The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light.
Author: John C. Stover
Publisher: Society of Photo Optical
ISBN: 9780819477767
Category : Science
Languages : en
Pages : 340
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Book Description
As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable. Softcover version of PM24.
Author: Craig F. Bohren
Publisher: John Wiley & Sons
ISBN: 3527618163
Category : Science
Languages : en
Pages : 544
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Book Description
Absorption and Scattering of Light by Small Particles Treating absorption and scattering in equal measure, this self-contained, interdisciplinary study examines and illustrates how small particles absorb and scatter light. The authors emphasize that any discussion of the optical behavior of small particles is inseparable from a full understanding of the optical behavior of the parent material-bulk matter. To divorce one concept from the other is to render any study on scattering theory seriously incomplete. Special features and important topics covered in this book include: * Classical theories of optical properties based on idealized models * Measurements for three representative materials: magnesium oxide, aluminum, and water * An extensive discussion of electromagnetic theory * Numerous exact and approximate solutions to various scattering problems * Examples and applications from physics, astrophysics, atmospheric physics, and biophysics * Some 500 references emphasizing work done since Kerker's 1969 work on scattering theory * Computer programs for calculating scattering by spheres, coated spheres, and infinite cylinders
Author: Adrian Doicu
Publisher: Springer
ISBN: 3540336974
Category : Science
Languages : en
Pages : 333
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Book Description
This book develops the theory of the null-field method (also called T-matrix method), covering almost all aspects and current applications. This book also incorporates FORTRAN programs and simulation results. Worked examples of the application of the FORTRAN programs show readers how to adapt or modify the programs for their specific application.
Author: Rémi Carminati
Publisher: Cambridge University Press
ISBN: 1107146933
Category : Science
Languages : en
Pages : 379
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Book Description
A systematic and accessible treatment of light scattering and transport in disordered media from first principles.
Author: Kuo-Nan Liou
Publisher: Cambridge University Press
ISBN: 0521889162
Category : Science
Languages : en
Pages : 461
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Book Description
This volume outlines the fundamentals and applications of light scattering, absorption and polarization processes involving ice crystals.
Author: Valery Tuchin
Publisher:
ISBN: 9781628415162
Category : Diagnostic imaging
Languages : en
Pages : 988
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Book Description
This third edition of the biomedical optics classic Tissue Optics covers the continued intensive growth in tissue optics—in particular, the field of tissue diagnostics and imaging—that has occurred since 2007. As in the first two editions, Part I describes fundamentals and basic research, and Part II presents instrumentation and medical applications. However, for the reader’s convenience, this third edition has been reorganized into 14 chapters instead of 9. The chapters covering optical coherence tomography, digital holography and interferometry, controlling optical properties of tissues, nonlinear spectroscopy, and imaging have all been substantially updated. The book is intended for researchers, teachers, and graduate and undergraduate students specializing in the physics of living systems, biomedical optics and biophotonics, laser biophysics, and applications of lasers in biomedicine. It can also be used as a textbook for courses in medical physics, medical engineering, and medical biology.
Author: Miroslaw Jonasz
Publisher: Elsevier
ISBN: 0080548679
Category : Science
Languages : en
Pages : 715
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Book Description
Light scattering-based methods are used to characterize small particles suspended in water in a wide range of disciplines ranging from oceanography, through medicine, to industry. The scope and accuracy of these methods steadily increases with the progress in light scattering research. This book focuses on the theoretical and experimental foundations of the study and modeling of light scattering by particles in water and critically evaluates the key constraints of light scattering models. It begins with a brief review of the relevant theoretical fundamentals of the interaction of light with condensed matter, followed by an extended discussion of the basic optical properties of pure water and seawater and the physical principles that explain them. The book continues with a discussion of key optical features of the pure water/seawater and the most common components of natural waters. In order to clarify and put in focus some of the basic physical principles and most important features of the experimental data on light scattering by particles in water, the authors employ simple models. The book concludes with extensive critical reviews of the experimental constraints of light scattering models: results of measurements of light scattering and of the key properties of the particles: size distribution, refractive index (composition), structure, and shape. These reviews guide the reader through literature scattered among more than 210 scientific journals and periodicals which represent a wide range of disciplines. A special emphasis is put on the methods of measuring both light scattering and the relevant properties of the particles, because principles of these methods may affect interpretation and applicability of the results. The book includes extensive guides to literature on light scattering data and instrumentation design, as well as on the data for size distributions, refractive indices, and shapes typical of particles in natural waters. It also features a comprehensive index, numerous cross-references, and a reference list with over 1370 entries. An errata sheet for this work can be found at: http://www.tpdsci.com/Ref/Jonasz_M_2007_LightScatE.php *Extensive reference section provides handy compilations of knowledge on the designs of light scattering meters, sources of experimental data, and more *Worked exercises and examples throughout
Author: Benjamin Chu
Publisher: Academic Press
ISBN: 032316188X
Category : Technology & Engineering
Languages : en
Pages : 354
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Book Description
Laser Light Scattering: Basic Principles and Practice, Second Edition deals with the technical aspects of laser light scattering, including the basic principles and practice. Topics covered include light scattering theory, optical mixing spectrometry, photon correlation spectroscopy, and interferometry. Experimental methods and methods of data analysis are also described. This book is comprised of eight chapters and begins with a discussion on the interrelationship between laser light scattering and other types of scattering techniques that use X-rays and neutrons, with particular reference to momentum and energy transfers as well as time-averaged and time-dependent scattered intensity. The spectrum of scattered light and a single-particle approach to time-averaged scattered intensity are considered. The following chapters focus on photoelectric detection of the scattered electric field; optical mixing spectrometers; basic equations for photon correlation spectroscopy; and the principles of Fabry-Perot interferometry. The pertinent features of the experimental aspects of laser light scattering are also outlined, together with the Laplace inversion problem. The final chapter examines polymer molecular-weight distributions in relation to particle sizing. This monograph will be of interest to physicists.
