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Author: Parag K. Lala
Publisher: Morgan & Claypool Publishers
ISBN: 1598293508
Category : Computers
Languages : en
Pages : 111
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Book Description
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Author: Parag K. Lala
Publisher: Morgan & Claypool Publishers
ISBN: 1598293508
Category : Computers
Languages : en
Pages : 111
Get Book
Book Description
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Author: Parag K. Lala
Publisher: Springer Nature
ISBN: 303179785X
Category : Technology & Engineering
Languages : en
Pages : 99
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Book Description
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Author: Parag K. Lala
Publisher: Academic Press
ISBN: 9780124343306
Category : Computers
Languages : en
Pages : 222
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Book Description
An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Author: Brock J. LaMeres
Publisher: Springer
ISBN: 3319538837
Category : Technology & Engineering
Languages : en
Pages : 459
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Book Description
This textbook for courses in Digital Systems Design introduces students to the fundamental hardware used in modern computers. Coverage includes both the classical approach to digital system design (i.e., pen and paper) in addition to the modern hardware description language (HDL) design approach (computer-based). Using this textbook enables readers to design digital systems using the modern HDL approach, but they have a broad foundation of knowledge of the underlying hardware and theory of their designs. This book is designed to match the way the material is actually taught in the classroom. Topics are presented in a manner which builds foundational knowledge before moving onto advanced topics. The author has designed the presentation with learning Goals and assessment at its core. Each section addresses a specific learning outcome that the student should be able to “do” after its completion. The concept checks and exercise problems provide a rich set of assessment tools to measure student performance on each outcome.
Author: Hideo Fujiwara
Publisher: MIT Press (MA)
ISBN: 9780262561990
Category : Business & Economics
Languages : en
Pages : 298
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Book Description
Today's computers must perform with increasing reliability, which in turn depends onthe problem of determining whether a circuit has been manufactured properly or behaves correctly.However, the greater circuit density of VLSI circuits and systems has made testing more difficultand costly. This book notes that one solution is to develop faster and more efficient algorithms togenerate test patterns or use design techniques to enhance testability - that is, "design fortestability." Design for testability techniques offer one approach toward alleviating this situationby adding enough extra circuitry to a circuit or chip to reduce the complexity of testing. Becausethe cost of hardware is decreasing as the cost of testing rises, there is now a growing interest inthese techniques for VLSI circuits.The first half of the book focuses on the problem of testing:test generation, fault simulation, and complexity of testing. The second half takes up the problemof design for testability: design techniques to minimize test application and/or test generationcost, scan design for sequential logic circuits, compact testing, built-in testing, and variousdesign techniques for testable systems.Hideo Fujiwara is an associate professor in the Department ofElectronics and Communication, Meiji University. Logic Testing and Design for Testability isincluded in the Computer Systems Series, edited by Herb Schwetman.
Author: Alexander Miczo
Publisher: Wiley
ISBN: 9780471604228
Category :
Languages : en
Pages : 480
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Book Description
The new standard in the field, presenting the latest design and testing methods for logic circuits, and the development of a BASIC-based simulation. Offers designers and test engineers unique coverage of circuit design for testability, stressing the incorporation of hardware into designs that facilitate testing and diagnosis by allowing greater access to internal circuits. Examines various ways of representing a design, as well as external testing methods that apply this information.
Author: Alfred Tarski
Publisher: Courier Corporation
ISBN: 0486318893
Category : Mathematics
Languages : en
Pages : 272
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Book Description
This classic undergraduate treatment examines the deductive method in its first part and explores applications of logic and methodology in constructing mathematical theories in its second part. Exercises appear throughout.
Author: Brock J. LaMeres
Publisher: Springer
ISBN: 3030136051
Category : Technology & Engineering
Languages : en
Pages : 492
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Book Description
This textbook for courses in Digital Systems Design introduces students to the fundamental hardware used in modern computers. Coverage includes both the classical approach to digital system design (i.e., pen and paper) in addition to the modern hardware description language (HDL) design approach (computer-based). Using this textbook enables readers to design digital systems using the modern HDL approach, but they have a broad foundation of knowledge of the underlying hardware and theory of their designs. This book is designed to match the way the material is actually taught in the classroom. Topics are presented in a manner which builds foundational knowledge before moving onto advanced topics. The author has designed the presentation with learning goals and assessment at its core. Each section addresses a specific learning outcome that the student should be able to “do” after its completion. The concept checks and exercise problems provide a rich set of assessment tools to measure student performance on each outcome.
Author: Ian A. Grout
Publisher: Springer Science & Business Media
ISBN: 9781846280238
Category : Technology & Engineering
Languages : en
Pages : 396
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Book Description
Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Author: DAVID PROTHEROE DOUGLAS LEWIN
Publisher: Springer
ISBN: 1489968563
Category : Computers
Languages : en
Pages : 713
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Book Description
