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Author: Paul van der Heide
Publisher: John Wiley & Sons
ISBN: 1118916778
Category : Science
Languages : en
Pages : 384
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Book Description
Serves as a practical reference for those involved in Secondary IonMass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields(Chemistry, Physics, Geology and Biology) to it is applied using upto date illustrations • Introduces the accepted fundamentals and pertinentmodels associated with elemental and molecular sputtering and ionemission • Covers the theory and modes of operation of theinstrumentation used in the various forms of SIMS (Static vsDynamic vs Cluster ion SIMS) • Details how data collection/processing can be carriedout, with an emphasis placed on how to recognize and avoid commonlyoccurring analysis induced distortions • Presented as concisely as believed possible with Allsections prepared such that they can be read independently of eachother
Author: Paul van der Heide
Publisher: John Wiley & Sons
ISBN: 1118916778
Category : Science
Languages : en
Pages : 384
Get Book
Book Description
Serves as a practical reference for those involved in Secondary IonMass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields(Chemistry, Physics, Geology and Biology) to it is applied using upto date illustrations • Introduces the accepted fundamentals and pertinentmodels associated with elemental and molecular sputtering and ionemission • Covers the theory and modes of operation of theinstrumentation used in the various forms of SIMS (Static vsDynamic vs Cluster ion SIMS) • Details how data collection/processing can be carriedout, with an emphasis placed on how to recognize and avoid commonlyoccurring analysis induced distortions • Presented as concisely as believed possible with Allsections prepared such that they can be read independently of eachother
Author: A. Benninghoven
Publisher: Springer Science & Business Media
ISBN: 3642618715
Category : Science
Languages : en
Pages : 310
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Book Description
Author: Alfred Benninghoven
Publisher: Springer Science & Business Media
ISBN: 3642827241
Category : Science
Languages : en
Pages : 578
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Book Description
This volume contains the proceedings of the Fifth International Confer ence on Secondary Ion Mass Spectrometry (SIMS V), held at the Capitol Holiday Inn, Washington, DC, USA, from September 30 to October 4, 1985. The conference was the fifth in a series of conferences held bienni ally. Previous conferences were held in Miinster (1977), Stanford (1979), Budapest (1981), and Osaka (1983). SIMS V was organized by Dr. R.J. Colton of the Nayal Research Lab oratory and Dr. D.S. Simons of the National Bureau of Standards un der the auspices of the International Organizing Committee chaired by Prof. A. Benninghoven of the Universitat Miinster. Dr. Richard F.K. Herzog served as the honorary chairman of SIMS V. While Dr. Herzog is best known to the mass spectrometry community for his theoretical development of a mass spectrometer design, known as the Mattauch-Herzog geometry, he also made several early and impor tant contributions to SIMS. In 1949, Herzog and Viehbock published a description of the first instrument designed to study secondary ions pro duced by bombardment from a beam of ions generated in a source that was separated from the sample by a narrow tube. Later at the GCA Cor poration, he brought together a team of researchers including H.J. Liebl, F.G. Riidenauer, W.P. Poschenrieder and F.G. Satkiewicz, who designed and built, and carried out applied research with the first commercial ion microprobe.
Author: A. Benninghoven
Publisher: Elsevier Science & Technology
ISBN:
Category : Science
Languages : en
Pages : 1092
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Book Description
Hardbound. This biennial conference series is the first international forum covering developments in Secondary Ion Mass Spectrometry. All aspects of the most recent developments in SIMS were covered by the scientific program: fundamentals, instrumentation, methodology, and analytical applications in different fields (semiconductors, polymer and organic materials, life sciences, environmental sciences, earth sciences, materials science). Related techniques and topics were also included.
Author: A. Benninghoven
Publisher:
ISBN: 9783642618727
Category :
Languages : en
Pages : 0
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Book Description
Author:
Publisher:
ISBN:
Category : Secondary ion mass spectrometry
Languages : en
Pages : 1098
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Book Description
Author: Sarah Fearn
Publisher: Morgan & Claypool Publishers
ISBN: 1681740885
Category : Technology & Engineering
Languages : en
Pages : 67
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Book Description
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.
Author: J. C. Vickerman
Publisher: IM Publications
ISBN: 1906715173
Category : Mass spectrometry
Languages : en
Pages : 742
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Book Description
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive
Author: J. C. Vickerman
Publisher: Oxford University Press, USA
ISBN:
Category : Business & Economics
Languages : en
Pages : 368
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Book Description
This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. The first three chapters introduce the basic physical and chemical principles involved and the theories which have been proposed to explain the process. Subsequent chapters describe the instrumental components of the SIMS apparatus, the use of SIMS as an analytical tool, and the development of the techniques of sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. Many practical examples are featured to illustrate the application of SIMS to real problems, possible pitfalls are pointed out, and data of use to analysts are collected in appendices. The book is a practical guide suitable for scientists in all fields who wish to use this valuable analytical technique.
Author: Christine M. Mahoney
Publisher: John Wiley & Sons
ISBN: 1118589246
Category : Science
Languages : en
Pages : 325
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Book Description
Explores the impact of the latest breakthroughs in cluster SIMS technology Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability to characterize soft samples as a result of damage from the atomic source. Molecular samples were essentially destroyed during analysis, limiting the method's sensitivity and precluding compositional depth profiling. The use of new and emerging cluster ion beam technologies has all but eliminated these limitations, enabling researchers to enter into new fields once considered unattainable by the SIMS method. With contributions from leading mass spectrometry researchers around the world, Cluster Secondary Ion Mass Spectrometry: Principles and Applications describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis. It serves as a compendium of knowledge on organic and polymeric surface and in-depth characterization using cluster ion beams. It covers topics ranging from the fundamentals and theory of cluster SIMS, to the important chemistries behind the success of the technique, as well as the wide-ranging applications of the technology. Examples of subjects covered include: Cluster SIMS theory and modeling Cluster ion source types and performance expectations Cluster ion beams for surface analysis experiments Molecular depth profiling and 3-D analysis with cluster ion beams Specialty applications ranging from biological samples analysis to semiconductors/metals analysis Future challenges and prospects for cluster SIMS This book is intended to benefit any scientist, ranging from beginning to advanced in level, with plenty of figures to help better understand complex concepts and processes. In addition, each chapter ends with a detailed reference set to the primary literature, facilitating further research into individual topics where desired. Cluster Secondary Ion Mass Spectrometry: Principles and Applications is a must-have read for any researcher in the surface analysis and/or imaging mass spectrometry fields.
