Rietveld Refinement in the Characterization of Crystalline Materials PDF Download
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Author: Igor Djerdj
Publisher: MDPI
ISBN: 3038975273
Category :
Languages : en
Pages : 89
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Book Description
This book is a printed edition of the Special Issue "Rietveld Refinement in the Characterization of Crystalline Materials" that was published in Crystals
Author: Igor Djerdj
Publisher: MDPI
ISBN: 3038975273
Category :
Languages : en
Pages : 89
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Book Description
This book is a printed edition of the Special Issue "Rietveld Refinement in the Characterization of Crystalline Materials" that was published in Crystals
Author: Igor Djerdj
Publisher:
ISBN: 9783038975281
Category : Electronic books
Languages : en
Pages : 1
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Book Description
This Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.
Author: Robert E. Dinnebier
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 3110461382
Category : Science
Languages : en
Pages : 347
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Book Description
Almost 50 years have passed since the famous papers of Hugo Rietveld from the late sixties where he describes a method for the refinement of crystal structures from neutron powder diffraction data. Soon after, the potential of the method for laboratory X-ray powder diffraction was discovered. Although the method is now widely accepted, there are still many pitfalls in the theoretical understanding and in practical daily use. This book closes the gap with a theoretical introduction for each chapter followed by a practical approach.The flexible macro type language of the Topas Rietveld software can be considered as the defacto standard.
Author: Robert Alan Young
Publisher: Oxford University Press, USA
ISBN:
Category : Language Arts & Disciplines
Languages : en
Pages : 320
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Book Description
The Rietveld method is a powerful and relatively new method for extracting detailed crystal structural information from X-ray and neutron powder diffraction data. Since such structural details dictate much of the physical and chemical attributes of materials, knowledge of them is crucial to our understanding of those properties and our ability to manipulate them. Since most materials of technological interest are not available as single crystals but often are available only in polycrystalline or powder form, the Rietveld method has become very important and is now widely used in all branches of science that deal with materials at the atomic level. This book, a collaboration by many authorities in the field, is intended primarily to have tutorial and advisory value for those who already have some experience with this important method, but an introductory chapter enables the book to be used as a first text for researchers starting in this area of science. The audience is thus comprised of all scientists using the method: graduate students who may be starting research in this area, powder diffraction specialists, crystallographers, physicists, chemists, and materials scientists.
Author: Eric J. Mittemeijer
Publisher: Springer Science & Business Media
ISBN: 3662067234
Category : Science
Languages : en
Pages : 557
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Book Description
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Author: Vitalij Pecharsky
Publisher: Springer Science & Business Media
ISBN: 0387095799
Category : Science
Languages : en
Pages : 751
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Book Description
A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example – R solving the crystal structure of Tylenol .
Author: Henryk Morawiec
Publisher: World Scientific
ISBN: 9814549649
Category :
Languages : en
Pages : 502
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Book Description
This volume covers the following areas — phase characterisation using diffraction methods; correction factors in powder diffraction; Rietveld method application; substructure analysis in textured materials; texture inhomogeneity and its determination; new X-ray diffraction methods; small angle scattering studies in crystalline and amorphous solids; X-Ray stress analysis; phase transitions particularly crystallography and pecularities of the reversible martensitic transformation; structure on non-crystalline materials and their crystallisation; structure and properties of new materials.
Author: Stroz Danuta
Publisher: World Scientific
ISBN: 9814545554
Category :
Languages : en
Pages : 512
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Book Description
The need to investigate functional differential equations with discontinuous delays is addressed in this book. Recording the work and findings of several scientists on differential equations with piecewise continuous arguments over the last few years, this book serves as a useful source of reference. Great interest is placed on discussing the stability, oscillation and periodic properties of the solutions. Considerable attention is also given to the study of initial and boundary-value problems for partial differential equations of mathematical physics with discontinuous time delays. In fact, a large part of the book is devoted to the exploration of differential and functional differential equations in spaces of generalized functions (distributions) and contains a wealth of new information in this area. Each topic discussed appears to provide ample opportunity for extending the known results. A list of new research topics and open problems is also included as an update.
Author: Vitalij Pecharsky
Publisher: Springer Science & Business Media
ISBN: 9781402073656
Category : Technology & Engineering
Languages : en
Pages : 752
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Book Description
Requires no prior knowledge of the subject, but is comprehensive and detailed making it useful for both the novice and experienced user of the powder diffraction method. Useful for any scientific or engineering background, where precise structural information is required. Comprehensively describes the state-of-the-art in structure determination from powder diffraction data both theoretically and practically using multiple examples of varying complexity. Pays particular attention to the utilization of Internet resources, especially the well-tested and freely available computer codes designed for processing of powder diffraction data.
Author: Georg Will
Publisher: Springer Science & Business Media
ISBN: 3540279865
Category : Science
Languages : en
Pages : 232
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Book Description
Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.
