Report on Space-radiation Damage to Electronic Components and Materials PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Report on Space-radiation Damage to Electronic Components and Materials PDF full book. Access full book title Report on Space-radiation Damage to Electronic Components and Materials by W. E. Chapin. Download full books in PDF and EPUB format.
Author: W. E. Chapin
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 76
Get Book
Book Description
Author: W. E. Chapin
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 76
Get Book
Book Description
Author: National Academies of Sciences, Engineering, and Medicine
Publisher: National Academies Press
ISBN: 030947079X
Category : Science
Languages : en
Pages : 89
Get Book
Book Description
Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.
Author: National Academies of Sciences, Engineering, and Medicine (U.S.). Committee on Space Radiation Effects Testing Infrastructure for the U.S. Space Program
Publisher:
ISBN: 9780309470803
Category : SCIENCE
Languages : en
Pages : 76
Get Book
Book Description
"Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future"--Publisher's description
Author:
Publisher: ASTM International
ISBN:
Category :
Languages : en
Pages : 73
Get Book
Book Description
Author: ASTM Committee E-10 on Radioisotopes and Radiation Effects
Publisher:
ISBN:
Category : Astrionics
Languages : en
Pages : 76
Get Book
Book Description
Author: C. Claeys
Publisher: Springer Science & Business Media
ISBN: 3662049740
Category : Science
Languages : en
Pages : 424
Get Book
Book Description
This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.
Author: Marta Bagatin
Publisher: CRC Press
ISBN: 1498722636
Category : Technology & Engineering
Languages : en
Pages : 394
Get Book
Book Description
Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories—static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time.
Author: Special study group on Space Radiation and Matter Chairman- Robert S. Shane
Publisher:
ISBN:
Category : Radiation
Languages : en
Pages : 61
Get Book
Book Description
Author: Wendell L. Hercules
Publisher:
ISBN:
Category : Environmental engineering
Languages : en
Pages : 164
Get Book
Book Description
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 912
Get Book
Book Description
