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Author:
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ISBN:
Category : Integrated circuits
Languages : en
Pages : 230
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Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 230
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Book Description
Author: IEEE Staff
Publisher:
ISBN: 9781538650721
Category :
Languages : en
Pages :
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Book Description
Developments in microelectronic test structures, measurements of those test structures, and application of those data for process and device characterization and modeling
Author:
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ISBN:
Category :
Languages : en
Pages : 275
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Book Description
Author: International Conference on Microelectronic Test Structures
Publisher:
ISBN:
Category :
Languages : en
Pages : 244
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Author:
Publisher:
ISBN: 9781424485284
Category : Electronic apparatus and appliances
Languages : en
Pages :
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ISBN: 9781467387934
Category :
Languages : en
Pages :
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Author:
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ISBN: 9781424469147
Category : Electronic apparatus and appliances
Languages : en
Pages : 235
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Author:
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ISBN: 9780780343481
Category :
Languages : en
Pages :
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Author: IEEE Staff
Publisher:
ISBN: 9781728140094
Category :
Languages : en
Pages :
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Book Description
Design, development, measurement, and analysis of microelectronic test structures
Author: IEEE Electron Devices Society
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780780352704
Category : Technology & Engineering
Languages : en
Pages : 235
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Book Description
The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions.
