Author: Publisher:
ISBN:
Category :
Languages : en
Pages : 0
Book Description
ICMTS 1991
Author: ICMTS 1991
Author: Publisher:
ISBN: 9780879425883
Category : Technology & Engineering
Languages : en
Pages : 264
Book Description
IEEE International Conference on Microelectronic Test Structures, 1991
Author: IEEE, Electron Devices Society StaffPublisher:
ISBN: 9780879425883
Category : Integrated circuits
Languages : en
Pages : 0
Book Description
National Semiconductor Metrology Program
Author: National Institute of Standards and Technology (U.S.)Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 160
Book Description
National Semiconductor Metrology Program
Author: National Semiconductor Metrology Program (U.S.)Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 160
Book Description
National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999
Author: National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000
Author: Semiconductor Measurement Technology
Author: National Institute of Standards and Technology (U.S.)Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 76
Book Description
Proceedings of the 1990 IEEE International Conference on Microelectronic Test Structures
Author: International Conference on Microelectronic Test StructuresPublisher:
ISBN:
Category :
Languages : en
Pages : 244
Book Description
Microelectronic Test Structures for CMOS Technology
Author: Manjul BhushanPublisher: Springer Science & Business Media
ISBN: 1441993770
Category : Technology & Engineering
Languages : en
Pages : 401
Book Description
Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements. Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors’ overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology.
