Author: Publisher:
ISBN:
Category :
Languages : en
Pages : 244
Book Description
ICMTS 1990
Author: Microelectronic Test Structures for CMOS Technology
Author: Manjul BhushanPublisher: Springer Science & Business Media
ISBN: 1441993770
Category : Technology & Engineering
Languages : en
Pages : 401
Book Description
Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements. Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors’ overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology.
The ESD Handbook
Author: Steven H. VoldmanPublisher: John Wiley & Sons
ISBN: 1119233135
Category : Technology & Engineering
Languages : en
Pages : 1172
Book Description
A practical and comprehensive reference that explores Electrostatic Discharge (ESD) in semiconductor components and electronic systems The ESD Handbook offers a comprehensive reference that explores topics relevant to ESD design in semiconductor components and explores ESD in various systems. Electrostatic discharge is a common problem in the semiconductor environment and this reference fills a gap in the literature by discussing ESD protection. Written by a noted expert on the topic, the text offers a topic-by-topic reference that includes illustrative figures, discussions, and drawings. The handbook covers a wide-range of topics including ESD in manufacturing (garments, wrist straps, and shoes); ESD Testing; ESD device physics; ESD semiconductor process effects; ESD failure mechanisms; ESD circuits in different technologies (CMOS, Bipolar, etc.); ESD circuit types (Pin, Power, Pin-to-Pin, etc.); and much more. In addition, the text includes a glossary, index, tables, illustrations, and a variety of case studies. Contains a well-organized reference that provides a quick review on a range of ESD topics Fills the gap in the current literature by providing information from purely scientific and physical aspects to practical applications Offers information in clear and accessible terms Written by the accomplished author of the popular ESD book series Written for technicians, operators, engineers, circuit designers, and failure analysis engineers, The ESD Handbook contains an accessible reference to ESD design and ESD systems.
IEEE International Conference on Microelectronic Test Structures, 1991
Author: IEEE, Electron Devices Society StaffPublisher:
ISBN: 9780879425883
Category : Integrated circuits
Languages : en
Pages : 0
Book Description
National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999
Author: Semiconductor Measurement Technology
Author: National Institute of Standards and Technology (U.S.)Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 72
Book Description
National Semiconductor Metrology Program
Author: National Semiconductor Metrology Program (U.S.)Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 120
Book Description
National Semiconductor Metrology Program
Author: National Institute of Standards and Technology (U.S.)Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 160
Book Description
National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000
Author: Proceedings of the 1990 IEEE International Conference on Microelectronic Test Structures
Author: International Conference on Microelectronic Test StructuresPublisher:
ISBN:
Category :
Languages : en
Pages : 244
Book Description
