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Author: David Brandon
Publisher: John Wiley & Sons
ISBN: 1118681487
Category : Technology & Engineering
Languages : en
Pages : 517
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Book Description
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.
Author: David Brandon
Publisher: John Wiley & Sons
ISBN: 1118681487
Category : Technology & Engineering
Languages : en
Pages : 517
Get Book
Book Description
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.
Author: David Brandon
Publisher: Wiley
ISBN: 0470727128
Category : Technology & Engineering
Languages : en
Pages : 550
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Book Description
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who?will find the book a useful and comprehensive general reference source.
Author: David Brandon
Publisher: Wiley
ISBN: 9780470027851
Category : Technology & Engineering
Languages : en
Pages : 0
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Book Description
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.
Author: Yang Leng
Publisher: John Wiley & Sons
ISBN: 0470822996
Category : Technology & Engineering
Languages : en
Pages : 384
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Book Description
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
Author: Karen Scrivener
Publisher: CRC Press
ISBN: 1498738672
Category : Technology & Engineering
Languages : en
Pages : 540
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Book Description
A Practical Guide from Top-Level Industry Scientists As advanced teaching and training in the development of cementitious materials increase, the need has emerged for an up-to-date practical guide to the field suitable for graduate students and junior and general practitioners. Get the Best Use of Different Techniques and Interpretations of the Results This edited volume provides the cement science community with a state-of-the-art overview of analytical techniques used in cement chemistry to study the hydration and microstructure of cements. Each chapter focuses on a specific technique, not only describing the basic principles behind the technique, but also providing essential, practical details on its application to the study of cement hydration. Each chapter sets out present best practice, and draws attention to the limitations and potential experimental pitfalls of the technique. Databases that supply examples and that support the analysis and interpretation of the experimental results strengthen a very valuable ready reference. Utilizing the day-to-day experience of practical experts in the field, this book: Covers sample preparation issues Discusses commonly used techniques for identifying and quantifying the phases making up cementitious materials (X-ray diffraction and thermogravimetric analysis) Presents good practice oncalorimetry and chemical shrinkage methods for studying cement hydration kinetics Examines two different applications of nuclear magnetic resonance (solid state NMR and proton relaxometry) Takes a look at electron microscopy, the preeminent microstructural characterization technique for cementitious materials Explains how to use and interpret mercury intrusion porosimetry Details techniques for powder characterization of cementitious materials Outlines the practical application of phase diagrams for hydrated cements Avoid common pitfalls by using A Practical Guide to Microstructural Analysis of Cementitious Materials. A one-of-a-kind reference providing the do’s and don’ts of cement chemistry, the book presents the latest research and development of characterisation techniques for cementitious materials, and serves as an invaluable resource for practicing professionals specializing in cement and concrete materials and other areas of cement and concrete technology.
Author: Manfred Rühle
Publisher: Springer Science & Business Media
ISBN: 9783540418184
Category : Medical
Languages : en
Pages : 460
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Book Description
This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.
Author: Gerhard Huebschen
Publisher: Woodhead Publishing
ISBN: 008100057X
Category : Technology & Engineering
Languages : en
Pages : 320
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Book Description
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques Reviews the determination of microstructural and mechanical properties Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Author: Joachim Ohser
Publisher: John Wiley & Sons
ISBN: 0471974862
Category : Mathematics
Languages : en
Pages : 420
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Book Description
The investigation of the origin and formation of microstructures and the effect that microstructure has on the properties of materials are important issues in materials science and technology. Geometrical analysis is often the key to understanding the formation of microstructures and the resulting material properties. The authors make use of mathematical morphology, spatial statistics, image processing, stereology and stochastic geometry to analyze microstructures arising in materials science. * Quantitative microstructure analysis is one of the most successful experimental techniques in materials science * Uses examples to demonstrate the techniques * Program code included enables the reader to apply the numerous algorithms * Accessible to material scientists with limited statistical knowledge Primarily aimed at applied materials scientists, the book will also appeal to those working and researching in earth sciences, material technology, mineralogy, petrography, image analysis, cytology and biology.
Author: M. A. Meyers
Publisher: Elsevier
ISBN: 0080537235
Category : Technology & Engineering
Languages : en
Pages : 317
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Book Description
The importance of the nanoscale effects has been recognized in materials research for over fifty years, but it is only recently that advanced characterization and fabrication methods are enabling scientists to build structures atom-by-atom or molecule-by molecule. The understanding and control of the nanostructure has been, to a large extent, made possible by new atomistic analysis and characterization methods pioneered by transmission electron microscopy. Nano and Microstructural Design of Advanced Materials focuses on the effective use of such advanced analysis and characterization techniques in the design of materials. Teaches effective use of advanced analysis and characterization methods at an atomistic level Contains many supporting examples of materials in which such design concepts have been successfully applied
Author: Wayne D. Kaplan
Publisher:
ISBN:
Category : Materials
Languages : en
Pages : 115
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Book Description
