Metrology. From Physics Fundamentals to Quality of Life. Course 196. International School of Physics «Enrico Fermi» PDF Download
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Author: P. Tavella
Publisher:
ISBN: 9788874381098
Category : Science
Languages : en
Pages : 536
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Book Description
Author: P. Tavella
Publisher:
ISBN: 9788874381098
Category : Science
Languages : en
Pages : 536
Get Book
Book Description
Author: P. Tavella
Publisher: IOS Press
ISBN: 1614998183
Category : Science
Languages : en
Pages : 528
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Book Description
Metrology is a constantly evolving field, and one which has developed in many ways in the last four decades. This book presents the proceedings of the Enrico Fermi Summer School on the topic of Metrology, held in Varenna, Italy, from 26 June to 6 July 2017. This was the 6th Enrico Fermi summer school devoted to metrology, the first having been held in 1976. The 2017 program addressed two major new directions for metrology: the work done in preparation for a possible re-definition of four of the base units of the SI in 2018, and the impact of the application of metrology to issues addressing quality of life – such as global climate change and clinical and food analysis – on science, citizens and society. The lectures were grouped into three modules: metrology for quality of life; fundamentals of metrology; and physical metrology and fundamental constants, and topics covered included food supply and safety; biomarkers; monitoring climate and air quality; new IS units; measurement uncertainty; fundamental constants; electrical metrology; optical frequency standards; and photometry and light metrology. The book provides an overview of the topics and changes relevant to metrology today, and will be of interest to both academics and all those whose work involves any of the various aspects of this field.
Author: P. Tavella
Publisher:
ISBN: 9781614998174
Category : International School of Physics "Enrico Fermi"
Languages : en
Pages : 0
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Book Description
Metrology is a constantly evolving field, and one which has developed in many ways in the last four decades.This book presents the proceedings of the Enrico Fermi Summer School on the topic of Metrology, held in Varenna, Italy, from 26 June to 6 July 2017. This was the 6th Enrico Fermi summer school devoted to metrology, the first having been held in 1976. The 2017 program addressed two major new directions for metrology: the work done in preparation for a possible re-definition of four of the base units of the SI in 2018, and the impact of the application of metrology to issues addressing quality of life - such as global climate change and clinical and food analysis - on science, citizens and society. The lectures were grouped into three modules: metrology for quality of life; fundamentals of metrology; and physical metrology and fundamental constants, and topics covered included food supply and safety; biomarkers; monitoring climate and air quality; new IS units; measurement uncertainty; fundamental constants; electrical metrology; optical frequency standards; and photometry and light metrology.The book provides an overview of the topics and changes relevant to metrology today, and will be of interest to both academics and all those whose work involves any of the various aspects of this field.
Author: Beat Jeckelmann
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 3110715902
Category : Technology & Engineering
Languages : en
Pages : 207
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Book Description
Metrology is part of the essential but largely hidden infrastructure of the modern world. This book concentrates on the infrastructure aspects of metrology. It introduces the underlying concepts: International system of units, traceability and uncertainty; and describes the concepts that are implemented to assure the comparability, reliability and quantifiable trust of measurement results. It is shown what benefits the traditional metrological principles have in fields as medicine or in the evaluation of cyber physical systems.
Author: M.J.T. Milton
Publisher: IOS Press
ISBN: 1643682474
Category : Science
Languages : en
Pages : 480
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Book Description
The use of standard and reliable measurements is essential in many areas of life, but nowhere is it of more crucial importance than in the world of science, and physics in particular. This book contains 20 contributions presented as part of Course 206 of the International School of Physics Enrico Fermi on New Frontiers for Metrology: From Biology and Chemistry to Quantum and Data Science, held in Varenna, Italy, from 4 -13 July 2019. The Course was the 7th in the Enrico Fermi series devoted to metrology, and followed a milestone in the history of measurement: the adoption of new definitions for the base units of the SI. During the Course, participants reviewed the decision and discussed how the new foundation for metrology is opening new possibilities for physics, with several of the lecturers reflecting on the implications for an easier exploration of the unification of quantum mechanics and gravity. A wide range of other topics were covered, from measuring color and appearance to atomic weights and radiation, and including the application of metrological principles to the management and interpretation of very large sets of scientific data and the application of metrology to biology. The book also contains a selection of posters from the best of those presented by students at the Course. Offering a fascinating exploration of the latest thinking on the subject of metrology, this book will be of interest to researchers and practitioners from many fields.
Author: Nadine de Courtenay
Publisher: Routledge
ISBN: 1351048961
Category : History
Languages : en
Pages : 223
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Book Description
Systems of units still fail to attract the philosophical attention they deserve, but this could change with the current reform of the International System of Units (SI). Most of the SI base units will henceforth be based on certain laws of nature and a choice of fundamental constants whose values will be frozen. The theoretical, experimental and institutional work required to implement the reform highlights the entanglement of scientific, technological and social features in scientific enterprise, while it also invites a philosophical inquiry that promises to overcome the tensions that have long obstructed science studies.
Author: Dinesh K. Aswal
Publisher: Springer Nature
ISBN: 9819920744
Category : Technology & Engineering
Languages : en
Pages : 2504
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Book Description
This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency metrology, certified reference materials, industrial metrology, industry 4.0, metrology in additive manufacturing, digital transformations in metrology, soft metrology and cyber security, optics in metrology, nano-metrology, metrology for advanced communication, environmental metrology, metrology in biomedical engineering, legal metrology and global trade, ionizing radiation metrology, advanced techniques in evaluation of measurement uncertainty, etc. The book has contributed chapters from world’s leading metrologists and experts on the diversified metrological theme. The internationally recognized team of editors adopt a consistent and systematic approach and writing style, including ample cross reference among topics, offering readers a user-friendly knowledgebase greater than the sum of its parts, perfect for frequent consultation. Moreover, the content of this volume is highly interdisciplinary in nature, with insights from not only metrology but also mechanical/material science, optics, physics, chemistry, biomedical and more. This handbook is ideal for academic and professional readers in the traditional and emerging areas of metrology and related fields.
Author: Dinesh K. Aswal
Publisher: Springer Nature
ISBN: 9811588724
Category : Technology & Engineering
Languages : en
Pages : 1084
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Book Description
This book describes the significance of metrology for inclusive growth in India and explains its application in the areas of physical–mechanical engineering, electrical and electronics, Indian standard time measurements, electromagnetic radiation, environment, biomedical, materials and Bhartiya Nirdeshak Dravyas (BND®). Using the framework of “Aswal Model”, it connects the metrology, in association with accreditation and standards, to the areas of science and technology, government and regulatory agencies, civil society and media, and various other industries. It presents critical analyses of the contributions made by CSIR-National Physical Laboratory (CSIR-NPL), India, through its world-class science and apex measurement facilities of international equivalence in the areas of industrial growth, strategic sector growth, environmental protection, cybersecurity, sustainable energy, affordable health, international trade, policy-making, etc. The book will be useful for science and engineering students, researchers, policymakers and entrepreneurs.
Author: A. Di Giuseppe
Publisher: IOS Press
ISBN: 1614993262
Category : Science
Languages : en
Pages : 567
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Book Description
The reliability and accuracy of systems of measurement continue to advance. We are about to enter a period of the most stable measurement system we can imagine with the anticipated new definitions of the SI units of measurement; a direct link between fundamental physics and metrology which will eliminate the current definition of the kilogram, until now based upon an artifact. This book presents selected papers from Course 185 of the Enrico Fermi International School of Physics, held in Varenna, Italy, in July 2012 and jointly organized with the Bureau International des Poids et Mesures (BIPM). The papers delivered at the school covered some of the most advanced topics in the discipline of metrology, including nano-technologies; quantum information and quantum devices; biology and medicine; food; surface quality; ionising radiation for health, environment, art and archaeology; and climate. The continuous and striking advances in basic research concerning atomic frequency standards operating both in the visible range and at microwave levels and the applications to satellite systems are also considered, in the framework of a historical review of the international organization of metrology, as are the problems inherent in uncertainty statements and definitions. This book will be of interest to all those whose work involves scientific measurement at the highest levels of accuracy.
Author: Theo W. Hänsch
Publisher: IOS Press
ISBN: 1586037846
Category : Computers
Languages : en
Pages : 683
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Book Description
One of the exciting characteristics of metrology is its intimate relationship between fundamental physics and the leading edge of technology which is needed to perform advanced and challenging experiments and measurements. This title includes a set of lectures which present the relevant progress in Metrology.
