2011 IEEE International Integrated Reliability Workshop Final Report PDF Download
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Author: IEEE Staff
Publisher:
ISBN: 9781457701139
Category : Integrated circuits
Languages : en
Pages : 164
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Book Description
Author: IEEE Staff
Publisher:
ISBN: 9781457701139
Category : Integrated circuits
Languages : en
Pages : 164
Get Book
Book Description
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 202
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Book Description
Author: IEEE Electron Devices Society
Publisher: IEEE
ISBN: 9780780371675
Category : Technology & Engineering
Languages : en
Pages : 106
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Book Description
Author:
Publisher:
ISBN:
Category : Electrical & Computer Engineering
Languages : en
Pages : 0
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Author:
Publisher:
ISBN: 9781479972746
Category :
Languages : en
Pages : 187
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Book Description
Author:
Publisher: IEEE
ISBN: 9781424440016
Category : Computers
Languages : en
Pages : 161
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Book Description
Author: IEEE Electron Devices Society
Publisher: IEEE
ISBN: 9780780335981
Category : Technology & Engineering
Languages : en
Pages : 175
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Book Description
The International Integrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability. The 1996 Final Report includes papers, abstracts, and summaries from the conference.
Author: IEEE Staff
Publisher:
ISBN: 9781479973088
Category :
Languages : en
Pages :
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Book Description
The IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 164
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Book Description
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 106
Get Book
Book Description
