Handbook of X-ray Photoelectron Spectroscopy PDF Download
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Author: John F. Moulder
Publisher: Perkin-Elmer, Physical Electronics Division
ISBN: 9780962702624
Category : Electron spectroscopy
Languages : en
Pages : 261
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Book Description
Author: John F. Moulder
Publisher: Perkin-Elmer, Physical Electronics Division
ISBN: 9780962702624
Category : Electron spectroscopy
Languages : en
Pages : 261
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Book Description
Author: John F. Moulder
Publisher:
ISBN: 9780964812413
Category : Electron spectroscopy
Languages : en
Pages : 261
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Book Description
Author: Jill Chastain
Publisher:
ISBN:
Category :
Languages : en
Pages : 261
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Book Description
Author: B. Vincent Crist
Publisher: John Wiley & Sons
ISBN: 0471492655
Category : Science
Languages : de
Pages : 562
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Book Description
These three volumes provide comprehensive information about the instrument, the samples, and the methods used to collect the spectra. The spectra are presented on a landscape format and cover a wide variety of elements,polymers, semiconductors, and other materials. Offers a clear presentation of spectra with the rightamount of experimental detail. All of the experiments have been conducted under controlled conditions on the same instrument by aworld-renowned expert.
Author: J. Theo Kloprogge
Publisher: Elsevier
ISBN: 012804523X
Category : Science
Languages : en
Pages : 532
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Book Description
Handbook of Mineral Spectroscopy, Volume 1: X-ray Photoelectron Spectra presents a database of X-ray Photoelectron spectra showing both survey (with chemical analysis) and high-resolution spectra of more than 200 rock-forming and major ore minerals. XPS of minerals is a very powerful technique for analyzing not only the chemical composition of minerals – including, for other techniques, difficult elements such as F and Cl, but also the local environment of atoms in a crystal structure. The book includes a section on silicates and on non-silicates, and is further subdivided according to the normal mineral classes. Brings together and expands upon the limited information available on the XPS of minerals into one handbook Features 2,500 full color, X-ray Photoelectron survey and high-resolution Spectra for use by researchers in the lab and as a reference Includes the chemical information of each mineral Written by experts with more than 50 years of combined mineral spectroscopy experience
Author: David Briggs
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 418
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Book Description
Author: John F. Watts
Publisher: John Wiley & Sons
ISBN: 1119417643
Category : Technology & Engineering
Languages : en
Pages : 307
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Book Description
Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.
Author: Joseph Woicik
Publisher: Springer
ISBN: 3319240439
Category : Science
Languages : en
Pages : 571
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Book Description
This book provides the first complete and up-to-date summary of the state of the art in HAXPES and motivates readers to harness its powerful capabilities in their own research. The chapters are written by experts. They include historical work, modern instrumentation, theory and applications. This book spans from physics to chemistry and materials science and engineering. In consideration of the rapid development of the technique, several chapters include highlights illustrating future opportunities as well.
Author: Paul van der Heide
Publisher: John Wiley & Sons
ISBN: 1118162900
Category : Science
Languages : en
Pages : 275
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Book Description
This book introduces readers interested in the field of X-ray Photoelectron Spectroscopy (XPS) to the practical concepts in this field. The book first introduces the reader to the language and concepts used in this field and then demonstrates how these concepts are applied. Including how the spectra are produced, factors that can influence the spectra (all initial and final state effects are discussed), how to derive speciation, volume analysed and how one controls this (includes depth profiling), and quantification along with background substraction and curve fitting methodologies. This is presented in a concise yet comprehensive manner and each section is prepared such that they can be read independently of each other, and all equations are presented using the most commonly used units. Greater emphasis has been placed on spectral understanding/interpretation. For completeness sake, a description of commonly used instrumentation is also presented. Finally, some complementary surface analytical techniques and associated concepts are reviewed for comparative purposes in stand-alone appendix sections.
Author: Günter H. Zschornack
Publisher: Springer Science & Business Media
ISBN: 3540286187
Category : Technology & Engineering
Languages : en
Pages : 969
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Book Description
This is the only handbook available on X-ray data. In a concise and informative manner, the most important data connected with the emission of characteristic X-ray lines are tabulated for all elements up to Z = 95 (Americium). The tabulated data are characterized and, in most cases, evaluated. Furthermore, all important processes and phenomena connected with the production, emission and detection of characteristic X-rays are discussed.
