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Author: Eric J. Mittemeijer
Publisher: Springer Science & Business Media
ISBN: 3662067234
Category : Science
Languages : en
Pages : 557
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Book Description
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Author: Eric J. Mittemeijer
Publisher: Springer Science & Business Media
ISBN: 3662067234
Category : Science
Languages : en
Pages : 557
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Book Description
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Author: Eric J. Mittemeijer
Publisher:
ISBN: 9783662067246
Category :
Languages : en
Pages : 580
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Book Description
Author: David Brandon
Publisher: John Wiley & Sons
ISBN: 1118681487
Category : Technology & Engineering
Languages : en
Pages : 517
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Book Description
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.
Author: Robert L. Snyder
Publisher: International Union of Crystal
ISBN: 9780198501893
Category : Science
Languages : en
Pages : 785
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Book Description
Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With theadvent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles tobroaden and sometimes to become asymmetric. Thus, information on the real structure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallitesize, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book provides a comprehensive analysis ofthe fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by thesimulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation,along with the size and strain distributions of each phase in a specimen. This book provides a complete summary of the developments of the twentieth century and points the way.
Author:
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 3486992562
Category : Science
Languages : en
Pages : 320
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Book Description
Zeitschrift für Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling Supplement Series of Zeitschrift für Kristallographie publishes Proceedings and Abstracts of international conferences on the interdisciplinary field of crystallography.
Author: E. J. Mittemeijer
Publisher:
ISBN:
Category : Crystal lattices
Languages : en
Pages : 324
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Book Description
Author: Adam J. Schwartz
Publisher: Springer Science & Business Media
ISBN: 1475732058
Category : Technology & Engineering
Languages : en
Pages : 352
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Book Description
Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).
Author: Gubicza, Jen?
Publisher: IGI Global
ISBN: 1466658533
Category : Technology & Engineering
Languages : en
Pages : 359
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Book Description
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
Author: Vadim Davydov
Publisher: LAP Lambert Academic Publishing
ISBN: 9783843320429
Category :
Languages : en
Pages : 172
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Book Description
In the current world of advanced technologies, materials play a key role in our day-to-day life, and the investigation of their mechanical properties with the aim of improvement, thus becomes a matter of crucial importance. Nondestructive studies of microstructure and of internal stresses coupled with in situ mechanical tests and diffraction techniques yield an attractive tool for materials scientists. This assists not only to a growth of this topic in significance but also to its development into the detached and relatively new scientific field of diffraction analysis. Neutron diffraction used in the listed works of this book as a main probe for materials, has become the most powerful technique for examination of microstructure and mechanical properties, and it is therefore considered as a prerequisite. In response to the needs of diligent fabricator of materials, striving for the improvement of materials quality, the topic of internal stress development pertains to the significantly relevant issues covered by this book.
Author: Valerie Randle
Publisher: Institute of Materials Minerals and Mining
ISBN: 9781902653839
Category : Engineering, General
Languages : en
Pages : 138
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Book Description
A cornerstone in the study of both natural and technological materials is characterisation of microstructure. In the widest sense this topic encompasses, for all phases present: morphology, including size and shape distributions; chemical composition; crystallographic parameters, including orientation and orientation relationships. A landmark advance for the materials community occurred with the genesis of 'microtexture', which for the first time provided integration of crystallographic parameters and other aspects of the microstructure. A definition of microtexture is: 'a population of crystallographic orientations whose individual components are linked to their location within the microstructure.' The term microtexture also describes any experimental technique used to determine this information. Essentially, a stationary beam of electrons is diffracted by atomic planes in the sampled volume of specimen. Analysis of the resulting diffraction pattern provides crystallographic information which can be related back to its position of origin.An estimated 95 percent of microtexture determination is by 'electron backscatter diffraction' (EBSD) in a scanning electron microscope (SEM), with the remaining 5 percent contributed mainly by transmission electron microscopy (TEM) counterparts to EBSD. Evaluation (indexing) of EBSD diffraction patterns and output of data in a variety of formats is in most cases fully automated. The most exciting EBSD output is an 'orientation map', which is a quantitative depiction of the microstructure in terms of its orientation constituents. Microtexture determination is now firmly established as the most comprehensive experimental tool for quantitative characterisation and analysis of microstructure, and is used extensively in both research and industry. Much has changed since this book was first published and the second edition has been completely rewritten to reflect these changes.
