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Author: Robert L. Snyder
Publisher: International Union of Crystal
ISBN: 9780198501893
Category : Science
Languages : en
Pages : 785
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Book Description
Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With theadvent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles tobroaden and sometimes to become asymmetric. Thus, information on the real structure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallitesize, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book provides a comprehensive analysis ofthe fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by thesimulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation,along with the size and strain distributions of each phase in a specimen. This book provides a complete summary of the developments of the twentieth century and points the way.
Author: Robert L. Snyder
Publisher: International Union of Crystal
ISBN: 9780198501893
Category : Science
Languages : en
Pages : 785
Get Book
Book Description
Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With theadvent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles tobroaden and sometimes to become asymmetric. Thus, information on the real structure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallitesize, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book provides a comprehensive analysis ofthe fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by thesimulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation,along with the size and strain distributions of each phase in a specimen. This book provides a complete summary of the developments of the twentieth century and points the way.
Author: Eric J. Mittemeijer
Publisher: Springer Science & Business Media
ISBN: 3662067234
Category : Science
Languages : en
Pages : 557
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Book Description
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Author: Rozaliya Barabash
Publisher: World Scientific
ISBN: 1908979631
Category : SCIENCE
Languages : en
Pages : 478
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Book Description
This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals. Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.
Author: M. H. Loretto
Publisher:
ISBN:
Category : Crystals
Languages : en
Pages : 152
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Book Description
Author: Oliver Diwald
Publisher: John Wiley & Sons
ISBN: 1119436761
Category : Technology & Engineering
Languages : en
Pages : 903
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Book Description
Ein umfassendes Referenzwerk für Chemiker und Industriefachleute zum Thema Nanopartikel Nanopartikel aus Metalloxid sind ein wesentlicher Bestandteil zahlreicher natürlicher und technologischer Prozesse ? von der Mineralumwandlung bis zur Elektronik. Darüber hinaus kommen Metalloxid-Nanopartikel in Pulverform im Maschinenbau, in der Elektronik und der Energietechnik zum Einsatz. Das Werk Metal Oxide Nanoparticles: Formation, Functional Properties and Interfaces stellt die wichtigsten Synthese- und Formulierungsansätze bei der Nutzung von Metalloxid-Nanopartikeln als Funktionsmaterialien vor. Es werden die üblichen Verarbeitungswege erklärt und die physikalischen und chemischen Eigenschaften der Partikel mithilfe von umfassenden und ergänzenden Charakterisierungsmethoden bewertet. Dieses Werk kann als Einführung in die Formulierung von Nanopartikeln, ihre Grenzflächenchemie und ihre funktionellen Eigenschaften im Nanobereich genutzt werden. Darüber hinaus dient es zum vertiefenden Verständnis, denn das Buch enthält detaillierte Angaben zu fortschrittlichen Methoden bei der physikalischen, chemischen, Oberflächen- und Grenzflächencharakterisierung von Metalloxid-Nanopartikeln in Pulvern und Dispersionen. *Erläuterung der Anwendung von Metalloxid-Nanopartikeln und der wirtschaftlichen Auswirkungen *Betrachtung der Partikelsynthese, einschließlich der Grundsätze ausgewählter Bottom-up-Strategien *Untersuchung der Formulierung von Nanopartikeln mit einer Auswahl von Verarbeitungs- und Anwendungswegen *Diskussion der Bedeutung von Partikeloberflächen und -grenzflächen für Strukturbildung, Stabilität und funktionelle Materialeigenschaften *Betrachtung der Charakterisierung von Metalloxid-Nanopartikeln auf verschiedenen Längenskalen In diesem Buch finden Forscher im akademischen Bereich, Chemiker in der Industrie und Doktoranden wichtige Erkenntnisse über die Synthese, Eigenschaften und Anwendungen von Metalloxid-Nanopartikeln.
Author: Daniel Chateigner
Publisher: John Wiley & Sons
ISBN: 1118622642
Category : Technology & Engineering
Languages : en
Pages : 382
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Book Description
This book introduces and details the key facets of Combined Analysis—an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The author starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Powder diffraction data treatment is introduced and in particular, the Rietveld analysis is discussed. The book also addresses automatic phase indexing—a necessary step to solve a structure ab initio. Since its effect prevails on real samples where textures are often stabilized, quantitative texture analysis is also detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models. Finally, the book introduces the combined analysis concept, showing how it is superior to the view presented when we look at only one part of the analyses. This book shows that the existence of texture in a specimen can be envisaged as a way to decouple ordinarily strongly correlated parameters, as measured for instance in powder diagrams, and to examine and detail deeper material characterizations in a single methodology.
Author: Horst Czichos
Publisher: Springer Science & Business Media
ISBN: 3642166415
Category : Technology & Engineering
Languages : en
Pages : 1244
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Book Description
This Springer Handbook of Metrology and Testing presents the principles of Metrology – the science of measurement – and the methods and techniques of Testing – determining the characteristics of a given product – as they apply to chemical and microstructural analysis, and to the measurement and testing of materials properties and performance, including modelling and simulation. The principal motivation for this Handbook stems from the increasing demands of technology for measurement results that can be used globally. Measurements within a local laboratory or manufacturing facility must be able to be reproduced accurately anywhere in the world. The book integrates knowledge from basic sciences and engineering disciplines, compiled by experts from internationally known metrology and testing institutions, and academe, as well as from industry, and conformity-assessment and accreditation bodies. The Commission of the European Union has expressed this as there is no science without measurements, no quality without testing, and no global markets without standards.
Author: Henryk Morawiec
Publisher: World Scientific
ISBN: 9810246137
Category : Science
Languages : en
Pages : 415
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Book Description
This proceedings volume contains research data from structural investigation of materials of high industrial value.
Author: Henryk Morawiec
Publisher: World Scientific
ISBN: 9814491098
Category : Technology & Engineering
Languages : en
Pages : 415
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Book Description
This proceedings volume contains research data from structural investigation of materials of high industrial value.
Author: E. J. Mittemeijer
Publisher:
ISBN:
Category : Crystal lattices
Languages : en
Pages : 324
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Book Description
