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Author: Manjul Bhushan
Publisher: Springer
ISBN: 1493913492
Category : Technology & Engineering
Languages : en
Pages : 424
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Book Description
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.
Author: Manjul Bhushan
Publisher: Springer
ISBN: 1493913492
Category : Technology & Engineering
Languages : en
Pages : 424
Get Book
Book Description
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.
Author: Manjul Bhushan
Publisher: Springer Science & Business Media
ISBN: 1441993770
Category : Technology & Engineering
Languages : en
Pages : 401
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Book Description
Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements. Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors’ overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology.
Author: James T. Healy
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 264
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Book Description
Author: Thomas Drugman
Publisher: Springer
ISBN: 3642388477
Category : Computers
Languages : en
Pages : 217
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Book Description
This book constitutes the proceedings of the 6th International Conference on Nonlinear Speech Processing, NOLISP 2013, held in Mons, Belgium, in June 2013. The 27 refereed papers included in this volume were carefully reviewed and selected from 34 submissions. The paper are organized in topical sections on speech and audio analysis; speech synthesis; speech-based biomedical applications; automatic speech recognition; and speech enhancement.
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 258
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Book Description
Author: Niraj K. Jha
Publisher: Springer Science & Business Media
ISBN: 1461315255
Category : Computers
Languages : en
Pages : 239
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Book Description
In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den sity and low power requirement. The ability to realize very com plex circuits on a single chip has brought about a revolution in the world of electronics and computers. However, the rapid advance ments in this area pose many new problems in the area of testing. Testing has become a very time-consuming process. In order to ease the burden of testing, many schemes for designing the circuit for improved testability have been presented. These design for testability techniques have begun to catch the attention of chip manufacturers. The trend is towards placing increased emphasis on these techniques. Another byproduct of the increase in the complexity of chips is their higher susceptibility to faults. In order to take care of this problem, we need to build fault-tolerant systems. The area of fault-tolerant computing has steadily gained in importance. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing. Due to the impor tance of CMOS technology, a significant portion of these courses may be devoted to CMOS testing. This book has been written as a reference text for such courses offered at the senior or graduate level. Familiarity with logic design and switching theory is assumed. The book should also prove to be useful to professionals working in the semiconductor industry.
Author: Ravi K. Gulati
Publisher: Springer Science & Business Media
ISBN: 1461531462
Category : Computers
Languages : en
Pages : 121
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Book Description
Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1062
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Book Description
Author: E. G. Stassinopoulos
Publisher:
ISBN:
Category : Space vehicles
Languages : en
Pages : 24
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Book Description
Author: Stefan Uhrig
Publisher: Springer Nature
ISBN: 303071389X
Category : Technology & Engineering
Languages : en
Pages : 169
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Book Description
This book provides a new multi-method, process-oriented approach towards speech quality assessment, which allows readers to examine the influence of speech transmission quality on a variety of perceptual and cognitive processes in human listeners. Fundamental concepts and methodologies surrounding the topic of process-oriented quality assessment are introduced and discussed. The book further describes a functional process model of human quality perception, which theoretically integrates results obtained in three experimental studies. This book’s conceptual ideas, empirical findings, and theoretical interpretations should be of particular interest to researchers working in the fields of Quality and Usability Engineering, Audio Engineering, Psychoacoustics, Audiology, and Psychophysiology.
