Characterization of Solid Surfaces

Characterization of Solid Surfaces PDF Author: Philip F. Kane
Publisher: Springer Science & Business Media
ISBN: 1461344905
Category : Technology & Engineering
Languages : en
Pages : 675

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Book Description
Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which eliminated the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, "Materials Character ization," to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.

Characterization of Solid Surfaces

Characterization of Solid Surfaces PDF Author: Philip F. Kane
Publisher: Springer Science & Business Media
ISBN: 1461344905
Category : Technology & Engineering
Languages : en
Pages : 675

Get Book

Book Description
Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined were average values. Sampling procedures were devised which eliminated the so-called sampling error. However, in the last decade or so, a number of developments have shown that, for many purposes, the distribution of defects within a material can confer important new properties on the material. Perhaps the most striking example of this is given by semiconductors; a whole new industry has emerged in barely twenty years based entirely on the controlled distribu tion of defects within what a few years before would have been regarded as a pure, homogeneous crystal. Other examples exist in biochemistry, metallurgy, polyiners and, of course, catalysis. In addition to this of the importance of distribution, there has also been a recognition growing awareness that physical defects are as important as chemical defects. (We are, of course, using the word defect to imply some dis continuity in the material, and not in any derogatory sense. ) This broadening of the field of interest led the Materials Advisory Board( I} to recommend a new definition for the discipline, "Materials Character ization," to encompass this wider concept of the determination of the structure and composition of materials. In characterizing a material, perhaps the most important special area of interest is the surface.

Characterization of Solid Surfaces

Characterization of Solid Surfaces PDF Author: Philip F. Kane
Publisher:
ISBN:
Category :
Languages : en
Pages :

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Book Description


Surface Characterization Methods

Surface Characterization Methods PDF Author: Andrew J. Milling
Publisher: CRC Press
ISBN: 9780824773366
Category : Science
Languages : en
Pages : 432

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Book Description
"Outlines the scientific basis and experimental methods for a broad sample of surface analysis techniques, drawing heavily from established principles of physical and analytical chemistry. Sketches a simple low-cost method of tracking particles in three dimensions."

Characterization of Thin Films and Solid Surfaces Using Proton-induced X-ray Emission

Characterization of Thin Films and Solid Surfaces Using Proton-induced X-ray Emission PDF Author: Bruce D. Sartwell
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 32

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Book Description


Surfaces and Interfaces of Solid Materials

Surfaces and Interfaces of Solid Materials PDF Author: Hans Lüth
Publisher: Springer Science & Business Media
ISBN: 3662031329
Category : Technology & Engineering
Languages : en
Pages : 508

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Book Description
Surfaces and Interfaces of Solid Materials emphasises both experimental and theoretical aspects of surface and interface physics. Beside the techniques of preparing well-defined solid surfaces and interfaces basic models for the description of structural, vibronic and electronic properties of interfaces are described, as well as fundamental aspects of adsorption and layer growth. Because of its importance for modern microelectronics special emphasis is placed on the electronic properties of semiconductor interfaces and heterostructures. Experimental topics covering the basics of ultrahigh-vacuum technology, electron optics, surface spectroscopies and electrical interface characterization techniques are presented in the form of separate panels.

Surfaces and Interfaces of Solids

Surfaces and Interfaces of Solids PDF Author: Hans Lüth
Publisher: Springer Science & Business Media
ISBN: 3662101599
Category : Technology & Engineering
Languages : en
Pages : 497

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Book Description
"Surfaces and Interfaces of Solids" emphasizes both experimental and theoretical aspects of surface and interface physics. Beside the techniques of preparing well-defined solid surfaces and interfaces basic models for the description of structural, vibronic and electronic properties ofinterfaces are described, as well as fundamental aspects of adsorption and layer growth. Because of its importance for modern microelectronics special emphasis is placed on the electronic properties of semiconductorinterfaces and heterostructures. Experimental topics covering the basics of ultrahigh-vacuum technology, electron optics, surface spectroscopies and electrical interface characterization techniques are presented in the form of separate panels.

Secondary Ion Mass Spectroscopy of Solid Surfaces

Secondary Ion Mass Spectroscopy of Solid Surfaces PDF Author: V. T. Cherepin
Publisher: CRC Press
ISBN: 1000083136
Category : Science
Languages : en
Pages : 127

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Book Description
This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces. It describes modern models of secondary ion formation and the factors influencing sensitivity of measurements and the range of applications. All the main parts of SIMS instruments are discussed in detail. Emphasising practical applications the book also considers the methods and analytical procedures for constitutional analysis of solids --- including metals, semiconductors, organic and biological samples. Methods of depth profiling, spatially multidimensional analysis and study of processes at the surface, such as adsorption, catalysis and oxidation, are given along with the application of SIMS in combination with other methods of surface analysis.

Surface Characterization

Surface Characterization PDF Author: Dag Brune
Publisher: John Wiley & Sons
ISBN: 3527612440
Category : Science
Languages : en
Pages : 715

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Book Description
"Surface Characterization" provides an authoritative guide to the wide range of powerful techniques that are used to characterize the surfaces of materials. Practical in approach, it not only describes the major analytical techniques but emphasizes how they can be used to solve a multitude of chemical and physical problems. A special feature of the book is that the various techniques are grouped according to the material property under investigation. These parts are preceded by an overview comparing the capabilities of the characterization methods available. Extensive data tables allow the reader to assess rapidly the strengths as well as the pitfalls inherent in each method. Chapters on chemical composition, optical and crystallographic properties, microtopography, surface processes, tribological, electrical and magnetic properties of surface films are featured. In addition, chapters specializing on applications within the life sciences on the microscopic scale and chemometrics are included. "Surface Characterization" is addressed to both academic and industrial audiences. Scientists and engineers working on the production and development of new materials will find it an invaluable reference source. Physicist, chemists, chemical engineers, material scientists and engineers from every area of materials research will benefit from the wealth of practical advice the book provides.

Microstructure and Thermal Analysis of Solid Surfaces

Microstructure and Thermal Analysis of Solid Surfaces PDF Author: Raouf Shaker Mikhail
Publisher: John Wiley & Sons
ISBN:
Category : Solids
Languages : en
Pages : 516

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Book Description


Surface Wetting

Surface Wetting PDF Author: Kock-Yee Law
Publisher: Springer
ISBN: 3319252143
Category : Technology & Engineering
Languages : en
Pages : 162

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Book Description
This book describes wetting fundamentals and reviews the standard protocol for contact angle measurements. The authors include a brief overview of applications of contact angle measurements in surface science and engineering. They also discuss recent advances and research trends in wetting fundamentals and include measurement techniques and data interpretation of contract angles.