Applications of Synchrotron Radiation Techniques to Materials Science IV: PDF Download
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Author: P. G. Allen
Publisher: Cambridge University Press
ISBN: 9781107412149
Category : Technology & Engineering
Languages : en
Pages : 216
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Book Description
Much like earlier books in the series, this collection of papers, first published in 2001, brings together the materials science community and the characterization techniques that use synchrotron radiation. Surfaces, interfaces, electronic materials, thin films, carbides, polymers and alloys are all addressed. And while the editors did not anticipate that the cluster of papers treating cementitious materials would necessitate a separate section, it is interesting to see the application of cutting-edge techniques to Portland cement, a very complex materials system long used in engineering structures. Topics include: X-ray diffraction - structures and transformations; X-ray diffraction - stress, strain and texture; microtomography and microdiffraction; SR methods applied to cementitious materials; magnetic materials; X-ray absorption and photoemission; and X-ray scattering and interfaces.
Author: P. G. Allen
Publisher: Cambridge University Press
ISBN: 9781107412149
Category : Technology & Engineering
Languages : en
Pages : 216
Get Book
Book Description
Much like earlier books in the series, this collection of papers, first published in 2001, brings together the materials science community and the characterization techniques that use synchrotron radiation. Surfaces, interfaces, electronic materials, thin films, carbides, polymers and alloys are all addressed. And while the editors did not anticipate that the cluster of papers treating cementitious materials would necessitate a separate section, it is interesting to see the application of cutting-edge techniques to Portland cement, a very complex materials system long used in engineering structures. Topics include: X-ray diffraction - structures and transformations; X-ray diffraction - stress, strain and texture; microtomography and microdiffraction; SR methods applied to cementitious materials; magnetic materials; X-ray absorption and photoemission; and X-ray scattering and interfaces.
Author: P. G. Allen
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 226
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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Much like earlier books in the series, this collection of papers, first published in 2001, brings together the materials science community and the characterization techniques that use synchrotron radiation.
Author: Dale L. Perry
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 382
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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author: Robert Birkmire
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 608
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Book Description
This book focuses on materials issues related to Cu(In,Ga)(Se,S)2 and CdTe-based polycrystalline thin-film photovoltaic solar cells and related oxides and chalcogenides. Phase equilibrium and thermochemical kinetic aspects of the absorber layer formation of CdTe and Cu(In,Ga)(Se,S)2 are emphasized and several papers on micro-analytical analysis report on detailed structural properties of thin films. The use of flexible plastic or metal foil substrates as an alternative to glass is addressed in terms of solar-cell performance and limitations imposed by the nature of the substrates. Properties of defects and interfaces in CdTe and CIGSS are highlighted using electrical, optical, and micro-analytical tools. While film properties are correlated to device physics, controversy still exists on the detailed operation of both CdTe and CIGSS devices. Topics include: materials and synthesis; thin films on alternate substrates; defects; growth and junction formation; surfaces and interfaces and film and device characterization.
Author: P. G. Allen
Publisher: Cambridge University Press
ISBN: 9781558996144
Category : Technology & Engineering
Languages : en
Pages : 224
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Book Description
Much like earlier books in the series, this collection of papers, first published in 2001, brings together the materials science community and the characterization techniques that use synchrotron radiation. Surfaces, interfaces, electronic materials, thin films, carbides, polymers and alloys are all addressed. And while the editors did not anticipate that the cluster of papers treating cementitious materials would necessitate a separate section, it is interesting to see the application of cutting-edge techniques to Portland cement, a very complex materials system long used in engineering structures. Topics include: X-ray diffraction - structures and transformations; X-ray diffraction - stress, strain and texture; microtomography and microdiffraction; SR methods applied to cementitious materials; magnetic materials; X-ray absorption and photoemission; and X-ray scattering and interfaces.
Author: Herman J. Borg
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 556
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Book Description
Author: S. A. Campbell
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 296
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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This volume was first published in 2002.
Author:
Publisher:
ISBN:
Category : Microactuators
Languages : en
Pages : 344
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Book Description
Author:
Publisher:
ISBN:
Category : Electric leakage
Languages : en
Pages : 296
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Book Description
Author: David S. Ginley
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 456
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Book Description
Oxide materials are rapidly impacting a broad spectrum of optoelectronic applications, from energy conservation to communications and computer memory. Developing a better understanding of the relationships between transport and microstructural phenomena is critical to the continued evolution of these applications. This volume reports on new materials and improved growth of films, and offers a much deeper level of understanding of the key determinates affecting the electro-optical performance of oxide-based devices. Transparent conducting oxides (TCOs), with a focus on p-type materials, are highlighted. One of the most exciting results in the TCO area is the report of CulnO2, where the material was doped n-type with Sn4+ and p-type with Ca2+. This is the first proven TCO system where homojunctions should be possible. Ferroelectric materials are another family of materials emerging in the area of DRAM and frequency-agile microwave electronics. A number of papers focus on the methods of controlling the interfacial properties of ferroelectric materials such as BaSrTiO3 on a variety of substrates. A number of groups are approaching atomic-level control of interfaces, allowing for the deposition of high-quality materials on substrates as diverse as Si and MgO. Embedded strain from the growth process for ferroelectric materials and other oxide systems is also demonstrated to be a critical determinate of the film. And a new model for ferroelectric materials indicates that a nanopolar reorientation transition may be responsible for the marked increase in dielectric tuning for nonstressed films. Topics include: transparent conducting oxides; transport and microstructural phenomena in oxide electronics; oxide-based devices; ferroelectric materials; and oxide thin-film growth.
