Advanced Techniques for Materials Characterization PDF Download
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Author: A.K. Tyagi
Publisher: Trans Tech Publications Ltd
ISBN: 303813323X
Category : Technology & Engineering
Languages : en
Pages : 528
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Book Description
Volume is indexed by Thomson Reuters BCI (WoS). Nowadays, an impressively large number of powerful characterization techniques is being used by physicists, chemists, biologists and engineers in order to solve analytical research problems; especially those related to the investigation of the properties of new materials for advanced applications. Although there are a few available books which deal with such experimental techniques, they are either too exhaustive and cover very few techniques or are too elementary to provide a solid basis for learning to use the characterization technique. Moreover, such books usually over-emphasize the textbook approach: being full of theoretical concepts and mathematical derivations, and omitting the practical instruction required in order to permit newcomers to use the techniques.
Author: A.K. Tyagi
Publisher: Trans Tech Publications Ltd
ISBN: 303813323X
Category : Technology & Engineering
Languages : en
Pages : 528
Get Book
Book Description
Volume is indexed by Thomson Reuters BCI (WoS). Nowadays, an impressively large number of powerful characterization techniques is being used by physicists, chemists, biologists and engineers in order to solve analytical research problems; especially those related to the investigation of the properties of new materials for advanced applications. Although there are a few available books which deal with such experimental techniques, they are either too exhaustive and cover very few techniques or are too elementary to provide a solid basis for learning to use the characterization technique. Moreover, such books usually over-emphasize the textbook approach: being full of theoretical concepts and mathematical derivations, and omitting the practical instruction required in order to permit newcomers to use the techniques.
Author: Sam Zhang
Publisher: CRC Press
ISBN: 1420042955
Category : Science
Languages : en
Pages : 344
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Book Description
Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today-whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material's structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researche
Author: Yang Leng
Publisher: John Wiley & Sons
ISBN: 0470822996
Category : Technology & Engineering
Languages : en
Pages : 384
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Book Description
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
Author: Sam Zhang
Publisher: CRC Press
ISBN:
Category : Science
Languages : en
Pages : 384
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Book Description
1. Introduction -- 2. Contact Angle in Surface Analysis -- 3. X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy -- 4. Scanning Tunneling Microscopy and Atomic Force Microscopy -- 5. X-ray Diffraction -- 6. Transmission Electron Miscroscopy -- 7. Scanning Electron Microscopy -- 8. Chromatographic Methods -- 9. Infrared Spectroscopy and UV/Vis Spectroscopy -- 10. Macro and Micro Thermal Analyses -- 11. Laser Confocal Fluorescence Microscopy.
Author: Surender Kumar Sharma
Publisher: Springer
ISBN: 3319929550
Category : Technology & Engineering
Languages : en
Pages : 613
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Book Description
This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.
Author: Daniel Abou-Ras
Publisher: John Wiley & Sons
ISBN: 352769904X
Category : Science
Languages : de
Pages : 760
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Book Description
The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D. Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.
Author: Alexander Ziegler
Publisher: Springer Science & Business Media
ISBN: 3642451527
Category : Science
Languages : en
Pages : 256
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Book Description
The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.
Author: Gerhard Huebschen
Publisher: Woodhead Publishing
ISBN: 008100057X
Category : Technology & Engineering
Languages : en
Pages : 320
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Book Description
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques Reviews the determination of microstructural and mechanical properties Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Author: Eric Lifshin
Publisher: John Wiley & Sons
ISBN: 3527613757
Category : Technology & Engineering
Languages : en
Pages : 277
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Book Description
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.
Author: Naryanaswami (Mohan) Ranganathan
Publisher: CRC Press
ISBN: 981461307X
Category : Technology & Engineering
Languages : en
Pages : 334
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Book Description
This book, which is a result of a coordinated effort by 22 researchers from five different countries, addresses the methods of determining the local and global mechanical properties of a variety of materials: metals, plastics, rubber, and ceramics. The first chapter treats nanoindentation techniques comprehensively. Chapter 2 concerns polymer surface properties using nanoindentation techniques. Chapter 3 deals with the wear properties of dental composites. Chapter 4 compares the global and local properties of a lead-free solder. Chapter 5 discusses the methods of determining plastic zones at the crack tip. Fatigue resistance of a synthetic polymer under different loading conditions is dealt with in Chapter 6. Chapter 7 is a review of the methods used to measure fatigue crack growth resistance. Chapter 8 treats bulk and surface properties of coated materials, and the final chapter presents a method for determining elastic constants using a resonance technique. All in all, its depth of coverage makes it a must-have for research scholars, graduate students, and teachers.
