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Author: David Nicholls
Publisher: RIAC
ISBN: 1933904356
Category : Technology & Engineering
Languages : en
Pages : 462
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Book Description
Historically, the reliability growth process has been thought of, and treated as, a reactive approach to growing reliability based on failures "discovered" during testing or, most unfortunately, once a system/product has been delivered to a customer. As a result, many reliability growth models are predicated on starting the reliability growth process at test time "zero", with some initial level of reliability (usually in the context of a time-based measure such as Mean Time Between Failure (MTBF)). Time "zero" represents the start of testing, and the initial reliability of the test item is based on its inherent design. The problem with this approach, still predominant today, is that it ignores opportunities to grow reliability during the design of a system or product, i.e., opportunities to go into reliability growth testing with a higher initial inherent reliability at time zero. In addition to the traditional approaches to reliability growth during test, this book explores the activities and opportunities that can be leveraged to promote and achieve reliability growth during the design phase of the overall system life cycle. The ability to do so as part of an integrated, proactive design environment has significant implications for developing and delivering reliable items quickly, on time and within budget. This book offers new definitions of how failures can be characterized, and how those new definitions can be used to develop metrics that will quantify how effective a Design for Reliability (DFR) process is in (1) identifying failure modes and (2) mitigating their root failure causes. Reliability growth can only occur in the presence of both elements.
Author: David Nicholls
Publisher: RIAC
ISBN: 1933904356
Category : Technology & Engineering
Languages : en
Pages : 462
Get Book
Book Description
Historically, the reliability growth process has been thought of, and treated as, a reactive approach to growing reliability based on failures "discovered" during testing or, most unfortunately, once a system/product has been delivered to a customer. As a result, many reliability growth models are predicated on starting the reliability growth process at test time "zero", with some initial level of reliability (usually in the context of a time-based measure such as Mean Time Between Failure (MTBF)). Time "zero" represents the start of testing, and the initial reliability of the test item is based on its inherent design. The problem with this approach, still predominant today, is that it ignores opportunities to grow reliability during the design of a system or product, i.e., opportunities to go into reliability growth testing with a higher initial inherent reliability at time zero. In addition to the traditional approaches to reliability growth during test, this book explores the activities and opportunities that can be leveraged to promote and achieve reliability growth during the design phase of the overall system life cycle. The ability to do so as part of an integrated, proactive design environment has significant implications for developing and delivering reliable items quickly, on time and within budget. This book offers new definitions of how failures can be characterized, and how those new definitions can be used to develop metrics that will quantify how effective a Design for Reliability (DFR) process is in (1) identifying failure modes and (2) mitigating their root failure causes. Reliability growth can only occur in the presence of both elements.
Author: Alessandro Birolini
Publisher: Springer Science & Business Media
ISBN: 364239535X
Category : Technology & Engineering
Languages : en
Pages : 626
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Book Description
This book shows how to build in, evaluate, and demonstrate reliability and availability of components, equipment, systems. It presents the state-of-the-art of reliability engineering, both in theory and practice, and is based on the author's more than 30 years experience in this field, half in industry and half as Professor of Reliability Engineering at the ETH, Zurich. The structure of the book allows rapid access to practical results. This final edition extend and replace all previous editions. New are, in particular, a strategy to mitigate incomplete coverage, a comprehensive introduction to human reliability with design guidelines and new models, and a refinement of reliability allocation, design guidelines for maintainability, and concepts related to regenerative stochastic processes. The set of problems for homework has been extended. Methods & tools are given in a way that they can be tailored to cover different reliability requirement levels and be used for safety analysis. Because of the Appendices A6 - A8, the book is also self contained from a mathematical point of view, and can be used as a text book or as a desktop reference, with a large number of tables (60), figures (190), and examples (210 of which 70 as problems for homework) to support the practical aspects.
Author: Michael A. Friedman
Publisher: William Andrew
ISBN: 0815513615
Category : Computers
Languages : en
Pages : 417
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Book Description
Reliability of Software Intensive Systems
Author: Panel on Reliability Growth Methods for Defense Systems
Publisher: National Academy Press
ISBN: 9780309314749
Category : Technology & Engineering
Languages : en
Pages : 235
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Book Description
A high percentage of defense systems fail to meet their reliability requirements. This is a serious problem for the U.S. Department of Defense (DOD), as well as the nation. Those systems are not only less likely to successfully carry out their intended missions, but they also could endanger the lives of the operators. Furthermore, reliability failures discovered after deployment can result in costly and strategic delays and the need for expensive redesign, which often limits the tactical situations in which the system can be used. Finally, systems that fail to meet their reliability requirements are much more likely to need additional scheduled and unscheduled maintenance and to need more spare parts and possibly replacement systems, all of which can substantially increase the life-cycle costs of a system. Beginning in 2008, DOD undertook a concerted effort to raise the priority of reliability through greater use of design for reliability techniques, reliability growth testing, and formal reliability growth modeling, by both the contractors and DOD units. To this end, handbooks, guidances, and formal memoranda were revised or newly issued to reduce the frequency of reliability deficiencies for defense systems in operational testing and the effects of those deficiencies. "Reliability Growth" evaluates these recent changes and, more generally, assesses how current DOD principles and practices could be modified to increase the likelihood that defense systems will satisfy their reliability requirements. This report examines changes to the reliability requirements for proposed systems; defines modern design and testing for reliability; discusses the contractor's role in reliability testing; and summarizes the current state of formal reliability growth modeling. The recommendations of "Reliability Growth" will improve the reliability of defense systems and protect the health of the valuable personnel who operate them.
Author: Eric Bauer
Publisher: John Wiley & Sons
ISBN: 1118075080
Category : Computers
Languages : en
Pages : 349
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Book Description
System reliability, availability and robustness are often not well understood by system architects, engineers and developers. They often don't understand what drives customer's availability expectations, how to frame verifiable availability/robustness requirements, how to manage and budget availability/robustness, how to methodically architect and design systems that meet robustness requirements, and so on. The book takes a very pragmatic approach of framing reliability and robustness as a functional aspect of a system so that architects, designers, developers and testers can address it as a concrete, functional attribute of a system, rather than an abstract, non-functional notion.
Author: John P. King
Publisher: Pearson Education
ISBN: 0137079222
Category : Technology & Engineering
Languages : en
Pages : 954
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Book Description
This book integrates key tools and processes into a comprehensive program for developing more robust and reliable technology-based products. Drawing on their extensive product development experience, the authors present a complete process for ensuring product performance throughout the entire lifecycle, from understanding customers’ needs through manufacturing and post-launch support. The authors begin by presenting broad insights and high-level strategies for improving product quality. Next, they demonstrate how to implement robustness and reliability strategies that complement existing governance and decision processes. A section on tools and methods shows how to institutionalize best practices and apply them consistently. Finally, they tie strategies, decisions, and methods together through a case study project. Product developers will learn how to Understand critical drivers of value in technology products, including reliability and durability Implement a process model and roadmap for improving reliability and robustness Increase robustness early in development, leading to shorter cycle times in later phases Improve the stability of production performance under stress conditions Assess both organizational and process capabilities for delivering robust and reliable products Understand and manage customer-driven requirements Use tools including descriptive and inferential statistics and DOE-based empirical models Managers will understand expectations for Design concepts supported by rigorous analyses of alternatives Products and processes delivering higher value to customers Products with higher reliability and longer useful lives Product processes with lower costs and higher capabilities Development projects having shorter, more predictable cycle times Readers are introduced to many thought leaders whose writings can be sources of further learning. This book is a valuable resource for anyone responsible for delivering reliable, profitable technology products, including general managers, program managers, engineers, scientists, and reliability and quality professionals.
Author: Adarsh Anand
Publisher: CRC Press
ISBN: 0429776578
Category : Mathematics
Languages : en
Pages : 142
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Book Description
The aim of this book is to provide a platform to academicians, practitioners, and researchers to understand current and future trends in software reliability growth modeling. Emphasis will be on qualitative work relevant to the theme with particular importance given to mathematical modeling for software reliability and various methods and applications of multi attributed decision making in governing the software performance. Presents software quality and security models Offers reliability analysis, assurance techniques for software systems Covers methodologies, tools, and practical applications of software reliability modeling and testing resources Includes robust reliability design techniques, diagnostic, and decision support Discusses stochastic modelling for software systems
Author: Ali Jamnia
Publisher: CRC Press
ISBN: 1351165704
Category : Technology & Engineering
Languages : en
Pages : 308
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Book Description
At an early stage of the development, the design teams should ask questions such as, "How reliable will my product be?" "How reliable should my product be?" And, "How frequently does the product need to be repaired / maintained?" To answer these questions, the design team needs to develop an understanding of how and why their products fails; then, make only those changes to improve reliability while remaining within cost budget. The body of available literature may be separated into three distinct categories: "theory" of reliability and its associated calculations; reliability analysis of test or field data – provided the data is well behaved; and, finally, establishing and managing organizational reliability activities. The problem remains that when design engineers face the question of design for reliability, they are often at a loss. What is missing in the reliability literature is a set of practical steps without the need to turn to heavy statistics. Executing Design for Reliability Within the Product Life Cycle provides a basic approach to conducting reliability-related streamlined engineering activities, balancing analysis with a high-level view of reliability within product design and development. This approach empowers design engineers with a practical understanding of reliability and its role in the design process, and helps design team members assigned to reliability roles and responsibilities to understand how to deploy and utilize reliability tools. The authors draw on their experience to show how these tools and processes are integrated within the design and development cycle to assure reliability, and also to verify and demonstrate this reliability to colleagues and customers.
Author: Kirk A. Gray
Publisher: John Wiley & Sons
ISBN: 1118700236
Category : Technology & Engineering
Languages : en
Pages : 298
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Book Description
NEXT GENERATION HALT AND HASS ROBUST DESIGN OF ELECTRONICS AND SYSTEMS A NEW APPROACH TO DISCOVERING AND CORRECTING SYSTEMS RELIABILITY RISKS Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics of failure based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly misapplication of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by demonstrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight into the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware–software interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. Key features: Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability. Challenges existing failure prediction methodologies by highlighting their limitations using real field data. Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems. Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits. Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS. Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process.
Author:
Publisher: ASM International
ISBN: 1627081518
Category : Technology & Engineering
Languages : en
Pages :
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Book Description
The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
