Author: Charles E. Stroud
Publisher:
ISBN: 9781475776256
Category :
Languages : en
Pages : 344
Book Description
A Designer's Guide to Built-In Self-Test
Author: Charles E. Stroud
Publisher:
ISBN: 9781475776256
Category :
Languages : en
Pages : 344
Book Description
Publisher:
ISBN: 9781475776256
Category :
Languages : en
Pages : 344
Book Description
A Designer’s Guide to Built-In Self-Test
Author: Charles E. Stroud
Publisher: Springer Science & Business Media
ISBN: 0306475049
Category : Technology & Engineering
Languages : en
Pages : 320
Book Description
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
Publisher: Springer Science & Business Media
ISBN: 0306475049
Category : Technology & Engineering
Languages : en
Pages : 320
Book Description
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
A Designer's Guide to Built-in Self-Test
Author: Charles E. Stroud
Publisher: Springer Science & Business Media
ISBN: 1402070500
Category : Business & Economics
Languages : en
Pages : 338
Book Description
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
Publisher: Springer Science & Business Media
ISBN: 1402070500
Category : Business & Economics
Languages : en
Pages : 338
Book Description
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
The Board Designer's Guide to Testable Logic Circuits
Author: Colin M. Maunder
Publisher: Addison Wesley Publishing Company
ISBN:
Category : Computers
Languages : en
Pages : 216
Book Description
Publisher: Addison Wesley Publishing Company
ISBN:
Category : Computers
Languages : en
Pages : 216
Book Description
Intel486 SL Microprocessor Superset System Design Guide
Author: Intel Corporation
Publisher: Intel Corporation (CA)
ISBN:
Category : Computers
Languages : en
Pages : 352
Book Description
Publisher: Intel Corporation (CA)
ISBN:
Category : Computers
Languages : en
Pages : 352
Book Description
Proceedings
Author:
Publisher:
ISBN:
Category : Automatic test equipment
Languages : en
Pages : 520
Book Description
Publisher:
ISBN:
Category : Automatic test equipment
Languages : en
Pages : 520
Book Description
A Practitioner's Guide to Software Test Design
Author: Lee Copeland
Publisher: Artech House
ISBN: 9781580537322
Category : Computers
Languages : en
Pages : 328
Book Description
Written by a leading expert in the field, this unique volume contains current test design approaches and focuses only on software test design. Copeland illustrates each test design through detailed examples and step-by-step instructions.
Publisher: Artech House
ISBN: 9781580537322
Category : Computers
Languages : en
Pages : 328
Book Description
Written by a leading expert in the field, this unique volume contains current test design approaches and focuses only on software test design. Copeland illustrates each test design through detailed examples and step-by-step instructions.
Design to Reduce Technical Risk
Author: American Telephone and Telegraph Company
Publisher: McGraw-Hill Companies
ISBN:
Category : Computers
Languages : en
Pages : 780
Book Description
Reduce the risk of design flaws with this step-by-step guide. Table of Contents: Design Policy, Process, and Analysis; Design Reviews; Software; Design for Test; Configuration Control; Design Release. Index. 215 illustrations.
Publisher: McGraw-Hill Companies
ISBN:
Category : Computers
Languages : en
Pages : 780
Book Description
Reduce the risk of design flaws with this step-by-step guide. Table of Contents: Design Policy, Process, and Analysis; Design Reviews; Software; Design for Test; Configuration Control; Design Release. Index. 215 illustrations.
System Design Interview - An Insider's Guide
Author: Alex Xu
Publisher: Independently Published
ISBN:
Category :
Languages : en
Pages : 280
Book Description
The system design interview is considered to be the most complex and most difficult technical job interview by many. Those questions are intimidating, but don't worry. It's just that nobody has taken the time to prepare you systematically. We take the time. We go slow. We draw lots of diagrams and use lots of examples. You'll learn step-by-step, one question at a time.Don't miss out.What's inside?- An insider's take on what interviewers really look for and why.- A 4-step framework for solving any system design interview question.- 16 real system design interview questions with detailed solutions.- 188 diagrams to visually explain how different systems work.
Publisher: Independently Published
ISBN:
Category :
Languages : en
Pages : 280
Book Description
The system design interview is considered to be the most complex and most difficult technical job interview by many. Those questions are intimidating, but don't worry. It's just that nobody has taken the time to prepare you systematically. We take the time. We go slow. We draw lots of diagrams and use lots of examples. You'll learn step-by-step, one question at a time.Don't miss out.What's inside?- An insider's take on what interviewers really look for and why.- A 4-step framework for solving any system design interview question.- 16 real system design interview questions with detailed solutions.- 188 diagrams to visually explain how different systems work.
IEEE VLSI Test Symposium
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 498
Book Description
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 498
Book Description